The M6 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF. Its design guarantees superior performance in all fields of SIMS applications. New ground-breaking ion beam and mass analyser technologies make the M6 the benchmark in SIMS instrumentation and the ideal tool for industrial and academic research.
High lateral resolution (< 50 nm) with the new Nanoprobe 50
Mass resolution > 30,000
Unique delayed extraction mode for high transmission with high lateral and high mass resolution simultaneously
Unmatched dynamic range and detection limits
TOF MS/MS with CID fragmentation for molecular structure elucidation
New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction