We are happy to announce that IONTOF will hold another virtual User School in April 2023 for our TOF-SIMS instrument users.
We will continue our very successful online format to host the User School in 2023, allowing our users to attend from all over the world conveniently.
The event is designed to assure an interactive exchange between participants and application scientists using our video conferencing tool. Due to the virtual setting of the IONTOF User School we have decided to offer several courses on different days. Each course is designed to last approximately three hours to cover the respective content, as well as leaving time for individual questions and exchange.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional face-to-face User School but also latest new features. This includes typical workflows in an analytical SIMS lab, ranging from sample holder preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.3 software.
All courses are dedicated to beginners in instrument usage as well as data analysis.
We will however strive to also include latest features of our software, so that our experienced users will benefit from attending as well.
If you would like to attend the IONTOF User School courses 2023 please use the registration form.
The registration will be free for all our existing customers.
Places will be allocated on a "first come first served" basis.
SurfaceLab 7.3 Release - New setting file concept for more intuitive instrument operation
With SurfaceLab 7.3 we just released the latest version of our extraordinary instrument operation and data analysis software.
The new release comes with a multitude of new features and improvements for operation of all our instruments as well as data evaluation.
A major improvement was made in how to start and operate our M6 instruments introducing a new common setting file concept, allowing to operate all analytical components by selecting default setting files from simple drop-down menus in the respective FPanel container or from the power on dialogue.
The new release also provides a fully remastered spectra printing dialogue, allowing a more convenient an efficient way to export your spectra to presentations or reports.
Further features are a new z-ROI and Lateral ROI setting menu, segmented y-scaling in spectra program, a new filter function for the Peak Evaluation Checkbox, support for a click of a button NIST library search and many, many more.
YouTube videos highlighting several features will become available in the coming months.
Several helpful videos on SurfaceLab 7 features and our IONTOF techniques are already available and will certainly help you with our software tools and to gain more knowledge of our technology.
All main features are described in our New Features of SurfaceLab 7.3 presentation available in your download area. All features and bugfixes are described in our Release Notes.
Remark: Please read the attached release notes carefully. Please also make sure to keep your SurfaceLab help updated.
04.07.2022
Successful Francophone IONTOF User Meeting 2022
On 22.06.2022 the French speaking IONTOF user community gathered in the historic amphitheatre Gintrac at the University of Bordeaux. The science presented by our IONTOF instrument users was very inspiring and absolutely fascinating. A great demonstration of the huge variety in application for the TOF-SIMS technology.
IONTOF would like to express our gratitude to the organizers Anouk Galtayries, Alain Brunelle and Nicolas Desbenoit for organising this meeting in such an historic place. We are very much looking forward to future francophone user meetings.
Historic amphitheatre Gintrac at the University of Bordeaux
20.04.2022
IUVSTA awards International Prize for Technology to Ian Gilmore, NPL Senior fellow
We are happy to announce that Professor Ian Gilmore, Senior Fellow at NPL London and visiting Professor at the University of Nottingham, has been awarded the IUVSTA Prize for Technology for pioneering advances in vacuum instrumentation. Our collaboration with Ian Gilmore resulted in the development of our M6 Hybrid SIMS instrument, combining an M6 TOF-SIMS instrument with an Orbitrap mass analyser, enabling innovative multidisciplinary research. The prize is the highest prize given by the IUVSTA every three years.
The International Union for Vacuum Science, Technique and Application (IUVSTA) represents nearly 15,000 scientists and engineers who are active in basic and applied vacuum research. IONTOF congratulates Ian Gilmore and his team for this outstanding and well deserved achievement.
IONTOF is very proud to inform that the Virtual IONTOF User School 2022 was a great success. With more than 220 participants from all continents joining our sessions we were able to introduce many of our users to the operation of our instruments, the conceptual design of experiments as well as the use of our powerful new SurfaceLab 7.3 software features, recently pre-released.
We thank all participants for their active participation and valued feedback throughout the sessions and will certainly continue this virtual seminar series in the future. Nevertheless, as soon as the pandemic situation allows safe face to face meetings again, we will also organize a European User School at our headquarters in Germany again.
01.03.2022
Virtual The Americas IONTOF User School 2022
We are happy to announce that IONTOF will hold a virtual User School on April 26th and 27th 2022 for our TOF-SIMS users in the Americas time zones.
Our applications specialists have designed an online program that will allow an interactive exchange between themselves and participants using our video conferencing tool. Each session is designed to last approximately three hours which should be enough time to cover the respective content, as well as leave time for individual questions and discussion.
The courses are dedicated to TOF-SIMS users and will cover data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.3 software.
If you would like to attend the Americas IONTOF User School courses 2022 please use the registration form below. Please note that places will be allocated on a "first come first served" basis.
We are happy to announce that IONTOF will hold another virtual User School in March and April 2022 for our TOF-SIMS instrument users.
Due to the current pandemic restrictions, IONTOF has designed an online format to host the User School in 2022, allowing our users to attend the event safely. The event is designed to assure an interactive exchange between participants and application scientists using our video conferencing tool. Due to the virtual setting of this year's IONTOF User School we have decided to offer several courses on different days. Each course is designed to last approximately three hours to cover the respective content, as well as leaving time for individual questions and exchange.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional face-to-face User School. This includes typical workflows in an analytical SIMS lab, ranging from sample holder preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.3 software.
All courses are dedicated to beginners in instrument usage as well as data analysis. We will however strive to also include latest features of our software, so that our experienced users will benefit from attending as well.
If you would like to attend the IONTOF User School courses 2022 please use the registration form below.
We decided to implement a few changes compared to last year:
1
The registration will be free for all our existing customers
2
The limitations per course are now up to 150 instead of 40 attendees.
Places will be allocated on a "first come first served" basis.
IONTOF Announces Formation of New Subsidiary, IONTOF Japan K.K.
In 1996, IONTOF installed the first TOF SIMS instrument in Japan. From the very beginning, IONTOF could count on strong partners who supported our technical know-how with their many years of experience in sales and service. In Japan, IONTOF was first represented by CAMECA Japan and later by Hitachi High-Tech Science. During these successful times, more than 70 instruments were installed and IONTOF developed from a newcomer to an established market leader for TOF-SIMS instrumentation worldwide.
To further strengthen and improve support for our Japanese customers, IONTOF is very pleased to announce the formation of IONTOF Japan K.K..
The new company will take over all Hitachi High-Tech Science sales and service activities from April 1, 2022 onwards.
We are very grateful and proud that almost the entire Hitachi High-Tech Science sales and service team will join the new company to continue the successful work and further improve the service with the new support, commitment and flexibility that only a smaller company can provide.
IONTOF Japan will have its premises at German Industry Park in Yokohama, where offices, spare parts stock, and our demonstration facility will be available in one spot.
We hope that you will continue to support our work and soon benefit from the results of the new and even closer cooperation between IONTOF Japan and its German-based parent company. Further information about the new setup can be found on our new IONTOF Japan homepage at
SurfaceLab 7.2 Release - New powerful functionalities for instrument operation and data analysis
With SurfaceLab 7.2 IONTOF just released the latest version of its extremely powerful instrument operation and data analysis software. The new release comes with a multitude of new features and improvements for instrument setup and alignment as well as data evaluation.
The feature list includes many improvements such as fully automated sputter beam alignment, sputter current optimisation, one click sputter crater positioning and many others to improve the ease-of-use significantly.
Also the data analysis package has been updated, featuring new methods for automated analysis of depth profiles, multiple sectional concentration scales, powerful routines to find implant peak positions, as well as significantly improved performance for the calculation of possible peak assignments, just to name a few...
The new release also provides full operation and data analysis support for the TOF MS/MS option of the M6 in addition to new features for the Hybrid SIMS operation like an adaptive ion injection system (AIIS).
To demonstrate the different software features of SurfaceLab 7.2 we will share further YouTube videos in the coming months. Several helpful videos on SurfaceLab 7 features and our IONTOF techniques are already available and will certainly help you with our software tools and to gain more knowledge of our technology. Please subscribe to our YouTube channel to stay tuned…
Remark: Please also make sure to keep your SurfaceLab help updated.
16.03.2021
Virtual IONTOF User School 2021
We are happy to announce that IONTOF will hold a User School in April and May 2021 for our TOF-SIMS instrument users. Due to the current pandemic restrictions, IONTOF has designed an online format to host the User School in 2021, allowing our users to attend the event safely.
The event is designed to assure an interactive exchange between participants and application scientists using our GoToMeeting video conferencing tool. Due to the virtual setting of this year's IONTOF User School we have decided to offer several courses on different days that may be booked individually.
The courses are dedicated to TOF-SIMS users and will cover all contents of the traditional IONTOF User School. This includes typical workflows in an analytical SIMS lab, ranging from sample preparation to the selection of appropriate measurement conditions and finally focusing on data evaluation and interpretation, using a comprehensive range of tools present in the latest SurfaceLab 7.2 software.
05.02.2021
New Honorary Fellows of the Royal Society of Chemistry announced
In 2020 the Royal Society of Chemistry's Board of Trustees announced Professor Emmanuel Iwuoha (University of the Western Cape, South Africa), Professor Pilar Goya Laza (Institute for Medicinal Chemistry, Madrid, Spain) and Professor Tebello Nyokong (Rhodes University, South Afrika) as new Honorary Fellows. Congratulations to all three for their outstanding academic achievements.
SurfaceLab 7 is the most recent instrument operation, data acquisition and data analysis software for all IONTOF instruments. With this versatile software IONTOF provides a professional solution for today's academic and industrial laboratories. Today, IONTOF has released the latest version of the extremely powerful SurfaceLab software. SurfaceLab 7.1 comes with a lot of improvements and new features. The release also includes IONTOF's new Multivariate Statistical Analysis (MVSA) package. The MVSA package is fully integrated and available for all SurfaceLab 7.1 users for free. We are sure that SurfaceLab 7.1 will again revolutionise the way TOF-SIMS data is handled.
To demonstrate the different software features we started to produce a series of YouTube videos, which we will release on a regular basis. The first videos are already online and we will add more content soon. So please feel free to subscribe to our YouTube channel to learn more about SurfaceLab and TOF-SIMS. Please go to…
Remark: Please also update your SurfaceLab help. Only the laterst help version (> 2022) is compatible with this bugfix release!
17.03.2020
IONTOF support during COVID-19 pandemic
As a reaction to the recent COVID-19 outbreak, IONTOF has put its pandemic contingency plan into effect. Currently the health and safety of our employees and their families have the uppermost priority. It is also our goal to maintain the highest possible level of customer service despite the present situation. As usual you will be able to reach the IONTOF support team by phone (+49 251 1622 200) or email (support@iontof.com). IONTOF also took precautions the ensure full spare part availability.
Official travel restrictions, however, limit our ability to provide on-site service. For the time being our engineers are not allowed to visit any customer sites. Please contact our hotline to check if we can find individual solutions in case you require on-site assistance.
We are sure that together we can get through this crisis and wish you and your families all the best for the coming weeks.
08.01.2020
Postdoctoral Position at the University in Gießen, Germany
The Justus-Liebig-University in Gießen offers a postdoctoral position in the research group of Prof. Jürgen Janek. Research will focus on the characterization of battery materials using ToF-SIMS, XPS and FIB-REM. The group of Prof. Janek is one of the leading groups in the field of battery research and offers a very attractive working environment. For more information, please contact:
After many years of constant commercial success, our current building finally reached its full capacity. To meet the demands of the next years IONTOF has now started to extend its current facility in Münster, Germany.
The new building extension will provide space for our entire service and service administration team and also provides additional storage space to support our extended product range. We hope that the new facility will be ready by the end of the second quarter 2020, a few months before the next SIMS Europe and our related user's meeting.
15.11.2019
Extremely Successful Launch of the all new M6 at SIMS 22 in Kyoto
The latest conference on secondary ion mass spectrometry (SIMS 22) was again a well organised and successful event. Thanks to Prof Jiro Matsuo and his team we all got a very positive impression of Japan and its unique culture.
Especially the conference dinner and the opportunity for selected participants to try on the traditional Japanese Kimono dress was very well received and we heard rumours that some candidates thought about changing their dress code even back home. For IONTOF the most important part of the conference was the launch of our all new M6.
Sven Kayser from the IONTOF sales team gave a comprehensive introduction of the new TOF-SIMS system during the first luncheon secession and we were all very pleased by the extremely positive response. It was very nice to finally see that all the hard work and the intensive design thoughts were appreciated by all our users.
13.05.2019
Learn more about Low Energy Ion Scattering (LEIS)
Thomas Grehl and Nathan Havercroft took the time to produce a series of short videos about low energy ion scattering. The series includes a general introduction into the technique but also covers other subjects such as quantification or thin film analysis. You can find the videos on our YouTube channel. Please go to…
The 26th International Conference on Ion Beam Analysis (IBA-2023) will be held in conjunction with the 18th PIXE conference in Toyama, Japan. This is the first trial for those communities to generate new cultural mixtures and fusions of outstanding knowledges and ideas in ion beam research fields.
The IBA-2023 conference will facilitate the exchange of findings and fresh concepts on Ion Beam Analysis and its associated methodologies among global colleagues from academia and industry.
The AVS International Symposium and Exhibition addresses cutting edge issues associated with materials, processing and interfaces in both the research and manufacturing communities. For IONTOF Julia Zakel, Thomas Grehl and Nathan Havercroft are happy to join this congress.
4th workshop for Microscopy and Microanalysis, Turku, Finland
Distinguished industrial and academic professionals will deliver insightful presentations covering a wide range of instrumentation topics, emphasizing practical analytical perspectives. This event offers a unique opportunity to acquire astute data analysis skills and optimize the extraction of valuable insights from raw data. Mats Eriksson from Spectral and Sven Kayser from IONTOF will join the meeting.
The UK Surface Analysis Forum (UKSAF) is a society for scientists from academia and industry with a common interest in the techniques and applications of surface analysis. It meets twice yearly, in January and July, to discuss the latest research and issues of interest to the surface analysis community and to exchange views on current trends. The topic of the next UKSAF meeting is "Surface Analysis for Sustainability". For IONTOF our local representatives from Scanwel as well as Matthias Kleine-Boymann will attend the meeting.
The International Conference on Secondary Ion Mass Spectrometry (SIMS 24) originally scheduled for 2023 was postponed to 2024 due to the COVID-19 pandemic. I will be held in La Rochelle, France. The conference will be the occasion for colleagues from both academia and industries to exchange results and news on Secondary Ion Mass Spectrometry and related techniques. The conference will cover advancements of scientific knowledge from fundamental understanding to new applications. The conference will be the occasion for colleagues from both academia and industries to exchange results and news on Secondary Ion Mass Spectrometry and related techniques. The conference will cover advancements of scientific knowledge from fundamental understanding to new applications. IONTOF will attend the meeting with several colleagues from R&D, Application and Sales. We look forward meeting you there.
